LAP-W320Wet laser particle size analyzerMain performance characteristics:
- Advanced optical path design: The LAP-W320 auxiliary detector adopts a multi-point mirror distribution design, and the auxiliary detector moves with the main detector when adjusting the optical path. Ensure that LAP-W320 has super strong stability and repeatability.
- Fully automated testing: Truly automated testing, all you do is put in the sample; No manual selection of data is required, ensuring the authority of instrument results.
- Dustproof and shockproof design: The instrument has been sealed as a whole, greatly improving the service life of internal components. The unique suspended structure can effectively avoid the interference of external vibrations on the instrument, making the result testing more stable and reliable.
- Neon laser: LAP-W320 uses a highly stable and long-life helium neon laser.
- Automatic calibration of optical path: Due to slight changes in the optical path caused by sample window replacement, the instrument can adjust the optical path by itself.
- Unique micro circulation system: The dispersion medium can be cycled for testing with a volume greater than 150 milliliters, truly achieving micro circulation testing.
- Bubble free design: The new design ensures that no bubbles enter the test sample window during the entire testing process, avoiding bubble interference.
- Sample residue free design: The instrument structure has been optimized, and there is no residual liquid in the instrument pipeline and circulation pump to avoid affecting the next test data.
- Sample window quick change device: The newly designed sample window quick change device makes sample window replacement more convenient and fast.
Wet laser particle size analyzerMain technical parameters:
LAP-W320 Technical Parameters |
|
Specification and model |
LAP-W320 |
Execution standards |
ISO13320,GB/T19077.1-2003 |
Range |
0.2~320μm |
Number of channels |
46 |
accuracy |
<1% (D50 deviation of standard sample) |
repeatability |
<1% (D50 deviation of standard sample) |
laser |
Helium neon laser with a wavelength of 632.8nm; p>2mW |
Optical path adjustment method |
Automatic alignment of optical path with an accuracy of 10um |
test speed |
<2min/time |
Interface method |
RS232 or USB mode. |